Kosaka Laboratories of Japan.
Metrology Instruments to Measure Surface Roughness and Profiles.
Roughness, Profiles, Nano Step heights, Waviness, Straightness, Roundness, Contour, Cylindricity, Parallelism,Squareness
Nano surface and step height for wafer and plastic surface measurement.
Workshop or laboratory roughness- surface measurement.
Portable Laboratory surface measurement.
Laboratory roundness ,
straihtness, cylindricity measurement.
Stand alone Surface analysers or PC based Laboratory systems
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metrology.uk@btconnect.com